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- Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the…18 kB (2248 palabras) - 17:22 21 abr 2024
- is sputtered at a constant rate. As the target is sputtered, the concentration and identity of sputtered atoms are measured using mass spectrometry. In…26 kB (3179 palabras) - 07:14 19 may 2024
- Ion source (redirección desde Plasma-desorption mass spectrometry)molecular ions is called secondary ion mass spectrometry (SIMS). Fission fragment ionization uses ionic or neutral atoms formed as a result of the nuclear…58 kB (7140 palabras) - 08:46 21 feb 2024
- of particles sputtered as ions Si= Sputtering yield of both ions and neutrals (particles/incident ion) fi±= Fraction of particles sputtered as ions; Ci=…13 kB (1754 palabras) - 07:49 29 abr 2024
- Resonance ionization (redirección desde Resonance ionization mass spectrometry)process of resonance ionization is based is termed resonance ionization mass spectrometry (RIMS). RIMS is derived from the original method, resonance ionization…26 kB (3289 palabras) - 19:39 15 sep 2023
- Atomic absorption spectroscopy (redirección desde Atomic absorption spectrometry)impact on the cathode, sputter cathode material that is excited in the glow discharge to emit the radiation of the sputtered material, i.e., the element…35 kB (4815 palabras) - 03:35 23 ene 2024
- Penning ionization (sección Mass spectrometry)layers. Multiple mass spectrometric techniques, including glow discharge mass spectrometry and direct analysis in real time mass spectrometry rely on penning…8 kB (1038 palabras) - 10:41 12 may 2024
- Low-energy ion scattering (redirección desde Low energy ion scattering spectrometry)incapable of providing true first-layer sensitivity. Secondary ion mass spectrometry (SIMS) involves the detection of ionic species ejected from a surface…26 kB (3472 palabras) - 13:31 24 mar 2024
- Solid immersion mirror SIMS – Secondary ion mass spectrometry SNMS – Sputtered neutral species mass spectrometry SNOM – Scanning near-field optical microscopy…14 kB (1385 palabras) - 22:11 8 may 2024
- Glow discharge (sección Sputtering)enough energy) will cause ionization. In atomic mass spectrometry, these ions are detected. Their mass identifies the type of atoms and their quantity…22 kB (2855 palabras) - 08:06 10 may 2024
- need to detect atoms sputtered from the lunar surface as well lighter ENAs, the ESA LENA on the Chandrayaan-1 incorporated a mass spectrometer designed…46 kB (5301 palabras) - 11:57 21 abr 2024
- Nuclear forensics (sección Mass Spectrometry)with a focused beam of primary ions. The sputtered, secondary ions are directed onto the mass spectrometry system to be measured. The secondary ions…24 kB (3182 palabras) - 23:31 19 abr 2023
- from the sputtered ions or secondary electrons is collected to form an image. At low primary beam currents, very little material is sputtered and modern…26 kB (3322 palabras) - 22:07 2 mar 2024
- of ion milling. Ion milling operates on the principles of sputtering and erosion. Sputtering occurs as the high-energy ions bombard the sample surface…12 kB (1329 palabras) - 11:15 11 feb 2024
- (ERDA), also referred to as forward recoil scattering (or, contextually, spectrometry), is an ion beam analysis technique in materials science to obtain elemental…68 kB (9596 palabras) - 00:52 11 may 2024
- increasingly used for analytical depth-profiling by secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS). Argon clusters…15 kB (1698 palabras) - 04:17 12 may 2024
- electrospray ionization mass spectrometry; it is the gas of choice for the plasma used in ICP spectroscopy. Argon is preferred for the sputter coating of specimens…39 kB (4633 palabras) - 00:10 25 ene 2024
- ; Sandel, B.R.; et al. (1981). "Overview of the Voyager Ultraviolet Spectrometry Results through Jupiter Encounter" (PDF). Journal of Geophysical Research…110 kB (10 543 palabras) - 02:19 21 may 2024
- H. (1966). "Observation of Astatine Compounds by Time-of-Flight Mass Spectrometry". Inorganic Chemistry. 5 (5): 766–769. doi:10.1021/ic50039a016. Pitzer…80 kB (9217 palabras) - 18:53 12 may 2024
- low-temperature plasma science and technology". International Journal of Mass Spectrometry. 248 (3): 87–102. Bibcode:2006IJMSp.248...87F. doi:10.1016/j.ijms…37 kB (5101 palabras) - 11:35 22 dic 2023
- metals or alloys has also been standard practice in secondary ion mass spectrometry (SIMS) since the 1970s. While there exist different field emitter…13 kB (1612 palabras) - 00:39 11 abr 2024